Machine Design

Detectors Displays Charged Particles And UV Radiation

A detector system lets designers determine the location, shape, and size of a charged particle or UV beam.

It can be used for ion-beam profiling for instrument design, high-energy physics experiments, and verifying ion-optic models. It consists of a 25-mm active-diameter microchannel plate detector on a conflate flange. The plates detect and amplify ion or photon events by producing a shower of electrons at the position of the input event. The resultant shower is converted to an optical image by a fiber-optic phosphor screen. This image is captured by a CCD camera and sent to a frame grabber, letting users manipulate and archive frames to PCs. The system includes a detector assembly with CCD camera mount, a frame-grabber board for installation into PCs, and software.

Burle Electro-Optics Inc.,
Sturbridge Business Park, Box 1159, Sturbridge, MA 01566,
(508) 347-4000, www.burle.com

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