Semiconductor-characterization system

July 11, 2001
The Model 4200-SCS semiconductor characterization system performs lab-grade dc device characterization with realtime plotting and analysis.

The Model 4200-SCS semiconductor characterization system performs lab-grade dc device characterization with realtime plotting and analysis. Built-in software helps with setup, data collection, analysis, and data storage. To speed measurements, an instrument structure allows simultaneous measurement of up to eight different measurement channels, and software needs only one mouse click to move between tests. A curve-trace application provides mouse-click access to view multiple on-screen data plots, automatic sequencing, and standard built-in test libraries. The software is a device-characterization application written for operation under Windows NT. The application provides test definition, parameter analysis and graphing, and automation.

Keithley Instruments Inc., 28775 Aurora Rd., Cleveland, OH 44139, (440) 248-0400.

Sponsored Recommendations

NEW Low Profile, Ultra Compact Power Supplies

March 13, 2024
Learn more HERE about Altech's Power supplies!

Altech's Liquid Tight Strain Relifs Catalog

March 13, 2024
With experienced Product Engineers and Customer Service personnel, Altech provides solutions to your most pressing application challenges. All with one thought in mind - to ensure...

Industrial Straight-Through Cable Gland

March 13, 2024
Learn more about Altech's cable glands and all they have to offer for your needs!

All-In-One DC-UPS Power Solutions

March 13, 2024
Introducing the All-In-One DC-UPS, a versatile solution combining multiple functionalities in a single device. Serving as a power supply, battery charger, battery care module,...

Voice your opinion!

To join the conversation, and become an exclusive member of Machine Design, create an account today!